High Resolution X-ray Diffractometry and Topography

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Author
Bowen, D.K. (University of Durham)
Publisher
Taylor & Francis Books Ltd
Publication Date
1998
Language
English
Standard
 Show Edition
On Shelf
Main Library - General Shelves
QD945 .B683
1 available
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Subjects

Subjects
Crystals
X-ray crystallography
X-rays - Diffraction

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Contributors
Tanner, B.K. (University of Warwick)
ISBN
9780850667585

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